Table 3-1. Digital Processor Test Set Controls, Indicators, and Connectors - Continued

TM 32-5811-024-14&P

Table 3-1. Digital Processor Test Set Controls, Indicators, and Connectors - Continued

Control, indicator, or

connector

Function

SER. INT. CONTROL (cont)

SER INT - Routes the output of serial interface

test CCA A6 to the digital processor test set octal

display (COMMAND DISPLAY).

AUTO SEND/MAN SEND

AUTO SEND - Automatically repeats test set trans-

(S8)

mission of serial COMMAND message (see COMMAND

below) to unit-under-test serial interface CCA at

a 10-kHz rate.

MAN SEND - Requires setting the SER. INT./SEND

switch for each serial test set COMMAND message

transmission to unit under test.

SER. INT. SEND

Manually transmits serial COMMAND message to unit

(S9)

under test with serial interface CCA.

COMMAND

The first switch on the left (S28) has two settings

(S28 thru S33)

(0 and 1), the remaining five switches have eight

settings (0 thru 7). Provide word for transmittal

to unit under test with serial interface CCA, word

command is in octal format.

TRANSCEIVER CONTROL

switches:

Controls three test relays within communication

processor transceiver I/O module A30.

X1/XO (S10)

X1,Y1 - Normal transceiver I/O test relay configura-

Y1/YO (S11)

tion for communication processor (CP) operation.

The CP configuration transmits and receives via the

data transceiver.

XO,Y1 - A loopback test configuration in which the

CP transmits via the voice transceiver and receives

via the data transceiver.

X1,YO - A loopback test configuration in which the

CP transmits via the data transceiver and receives

via the voice transceiver.

XO,YO - A loopback test configuration in which

the transceiver I/O biphase-L encoded output is

internally fed back into the biphase-L decoding

circuits.

3-3