Table 3-1. Digital Processor Test Set Controls, Indicators, and Connectors - Continued

TM 32-5811-024-14&P

Table 3-1. Digital Processor Test Set Controls, Indicators, and Connectors - Continued

Control, indicator, or

connector

Function

TRANSCEIVER CONTROL (cont)

BYPASS/OFF/KEY

BYPASS - Inverts the transceiver I/O biphase-L

(S12)

output data stream for communication processor

loopback tests.

OFF - Deactivates BYPASS and KEY function.

KEY - Activates transceiver I/O module transceiver

keying circuits (drives key-R monitoring output

low).

Xmit Clock - Provides transmitting data clock to

test unit-under-test transceiver I/O module

operation.

Xmit Data - Provides transmitting data to test

unit-under-test transceiver I/O module operation.

CONT. IND. TEST

switches:

TEST CARD/NORM/

TEST CARD - Used with UPDATE switch to check digital

DISP.

processor test set control indicator test circuit.

(S13)

When UPDATE switch is set and all lamps on the commu-

nication processor control-indicator are lit, the

test card will check good.

NORM - Allows testing of the entire control-indi-

cator.

DISP. - Used with the UPDATE switch to test

communication processor control-indicator lamp

driver CCA Al and the indicator lamps.

UPDATE

Executes TEST CARD or DISP. test functions.

COMM. PROC. TEST

switches:

CMD 1/CMD 2

CMD 1 - Generates a unique 32-bit control-indicator

(S15)

word (CMD 1), which is applied to communication

processor control-indicator interface CCA A20

twice per second.

CMD 2 - Generates a unique 32-bit control-indicator

word (CMD 2), which is applied to communication

processor control-indicator interface CCA A20 twice

per second.

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