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Page Title:
Sectionalization Test Using AN/TPM-25A |
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 d. Sectionalization Test Using AN/TPM-25A.
Paragraph
Procedure
Normal Indication
reference
Test equipment
Equipment under test
a. None
a. Connect the equipment as illustrated
M E - 2 6 B / U FUNCTION
1
MODE: 1 FUNCTION:
in figure 3-1, except for dc probe.
(+) RANGE: 30V
SYSTEM ISLS: OFF
28 VDC 115-VAC
b. Set the transponder test set 28
b. None
OFF: OFF
vdc 115 VAC switch to 115 VAC
c. +28 vdc 3.
c. Set the ME 26B/U FUNCTION
switch (+) and turn on the test
set Allow 2 minutes warmup time
Connect the dc test probe to test
point A13TP4.
d. Connect the ME 26B/U dc test probe
d. +12 vdc l.
to test point A13TP3. Observe the
meter indication.
ME 26B/U
2
12 vdc l.
c. Connect the dc test probe to test point
A13TP1 and observe the meter in
FUNCTION: (-)
dication.
3
ME 26B/U
+150 vdc 5.
Connect the dc test probe to test point
FUNCTION: (+) RANGE:
A14TP3 and observe the meter in
300V
dication.
4
AN/TPM-25A
a. None.
a. Connect equipment as shown in
MODE 1 FUNCTION:
POWER ON
figure 3-22, to perform system
SYSTEM
MEASUREMENT
timing test.
FUNCTION SEL: PWR
b. None
b. On AN/USM-281A, observe positive
PUSH TO TEST LOCK
REPLIES MODULATION
28 VDC 115 VAC OFF:
going prf pulse from A5TP5 on A
SEL: SIF
115VAC
INPUT, and the delayed prf pulse
RANGE DELAY
from the AN/UPM-15A on B IN-
SEL: 0100
PUT.
PRT
SEL
c. None.
c. A d j u s t
AN/UPM-15A PULSE
(USEC):
Immaterial
DELAY to position the delayed prf
TRIG SEL INT DCD/
pulse approximately .5 ms before the
EXT EXT
trailing edge of the prf pulse.
d. CL ACCEPT lamp is on.
SIG GEN FUNCTION:
d. Continue adjustment of PULSE
FIXED FREQ AN/USM-
DELAY as required until the trans-
281A
sponder test set ACCEPT lamp is on
POWER: ON Sweep dis
solidly.
play
switch:
MAIN
DELAYED TIME/DIV:
OFF
MAIN TIME/DIV: 1 MSEC
INT/AUTO/EXT/EXT 10:
AUTO
MAIN - SLOPE + : +
DIV DELAY: Immaterial
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